DB-FIB
Mau oyamba a Utumiki
Pakadali pano, DB-FIB (Dual Beam Focused Ion Beam) imagwiritsidwa ntchito kwambiri pakufufuza ndi kuyang'anira zinthu m'magawo onse monga:
Ceramic zipangizo,Ma polima,Zida zachitsulo,Maphunziro a Biological,Semiconductors,Geology
Kuchuluka kwa utumiki
Zipangizo za semiconductor, organic tinthu tating'onoting'ono ta molekyulu, zida za polima, organic/inorganic hybrid materials, inorganic non-metal materials
Background Service
Ndi kupita patsogolo kwachangu kwa zida zamagetsi za semiconductor ndi ukadaulo wophatikizika wozungulira, kuchulukirachulukira kwa zida ndi madongosolo ozungulira kwakweza zofunikira pakuwunika kwa microelectronic chip process, kusanthula kulephera, ndi kupanga yaying'ono / nano.Dongosolo la Dual Beam FIB-SEM, ndi luso lake lamphamvu la makina ochapira ndi kusanthula ma microscopic, lakhala lofunika kwambiri pakupanga ndi kupanga ma microelectronic.
Dongosolo la Dual Beam FIB-SEMimaphatikizanso Focused Ion Beam (FIB) ndi Scanning Electron Microscope (SEM). Imathandizira kuyang'ana kwa SEM zenizeni zenizeni za FIB-based micromachining process, kuphatikiza kusanja kwamtunda kwa mtengo wa elekitironi ndi kuthekera kolondola kwazinthu zopangira ma ion mtengo.
Zinthu Zothandizira
Tsamba-Specific Cross-Section Kukonzekera
TEM Kujambula ndi Kusanthula Zitsanzo
Selective Etching kapena Enhanced Etching Inspection
MEtal ndi Insulating Layer Deposition Testing
ZogwirizanaPRODUCTS
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Pamwamba